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X-eye SF160FSL

  • Non-destructive analysis of semiconductor, SMT, and electron/electric components
  • Hybrid Tube Option (160kv/500㎛, 10,000hrs/filament)
  • Dual CT – High-quality CT image / high speed scan

Best performance X-ray Inspection System
High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable.
High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.
Dual CT function can be purchased additionally, and exact location & size of defects can be detected and analyzed with this function.

Description

About the X-eye SF160FSL

Specifications
X-ray Tube 160kV / 200uA
Min. Resolution 0.9um
Table Size 550 × 650mm
AXIS X, Y, Z, R, T, Y-AFT
Detector 5 inch FPXD
CT Scan Method OBCT-Oblique, CBCT-Con Beam
Foot print 1,723(W) x 1,740(D) x 1,740(H) mm
Weight 2,500kg
BGA Cold Solder
Stacked Die

    X-eye SF160FSL Quick contact

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