SNE-3000MS
- Category: Scanning Electron Microscopes
- Manufacturer: SEC
Specifications
| Electron System | ||||||
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| Stage System | ||||||
| Image System | ||||||
| Vacuum System | ||||||
| Dimensions | ||||||
| Resolution |
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| Magnification | 20x~60,000x | |||||
| Accelerating Voltage | 1~30kV (1/5/10/15/20/30) | |||||
| Detector |
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| Electron Gun | Pre-centered Tungsten Filament Cartridge | |||||
| Stage Traverse |
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| Max. Sample Size | 70mm in Diameter x 30mm in Height | |||||
| Automation Function |
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| Image Format | BMP, JPEG, PNG, TIFF | |||||
| Vacuum Mode | High & Low Vacuum | |||||
| Vacuum Pump | Rotary Pump / Turbo Molecular Pump (Full Automation) | |||||
| Main Unit | 390(W)x380(D)x560(H)mm, 83kg | |||||
| Controller Unit | 390(W)x325(D)x560(H)mm, 37kg | |||||
| Rotary Pump | 400(W)x160(D)x340(H)mm, 24kg |
▼ Show all specs
About the SNE-3000MS
| The standard of Table-top SEM, SNE-3000MS |
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| 15nm Resolution | 60,000x Magnification | SE Image SE Detector |
| The most appropriate Table-top SEM for the surface inspection with 10,000x of magnification which is main inspection range by SEM Entry-level Table-top SEM with 15nm resolution & 60,000x magnification |
SE (Secondary Electron) ▷ Create images with the height level information. Mostly used for surface inspection |
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| Stage System X,Y,R (3-axis) Beam Shift: 150μm | Auto Setting Focus, Contrast, Brightness | Simple S/W Convenient Operation |
| Convenient stage movement by 3-axis and able to operate easily and conveniently with mouse control in U.I Able to get various analysis results with various scan modes measurement tool |
