Quadra™ W8
- Category: Uncategorized
- Manufacturer:
Wafer X-ray Inspection
Quadra W8 is a versatile, lab based solution for wafer level inspection offering industry leading magnification and image quality.
- Check shape, fill level and voiding in TSV through silicon vias.
- Inspect build quality, wire bonds, component alignment and solder & adhesive voiding during MEMS manufacture.
- Check for bump presence, shape, position and voiding in wafer bumps.
- Find defects such as cold joints, head in pillow and misalignment in 2.5D and 3D wafer level packages.
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Integrated wafer handling ensures operators can inspect wafer level quality directly from the FOUP without needing to handle the wafer.
About the Quadra™ W8
See the finest details Quadra™ W8 creates unbeatable images making it easy to see even the tiniest details and find defects quickly.- Integrated image chain reveals defects as small as 0.1µm. Tube, power supply and detector are all designed and manufactured in house for electronics applications
- Advanced enhancement filters bring out the sharpest images
- Unbeatable resolution with the Aspire 6.7 MP detector
- Minimize operator training with intuitive Gensys software
- Automate image acquisition with AIR routines
- Find defects fast with mouse point and click control
- EFEM handling ensures complete wafer protection
- SECS/GEM factory host integration for tracking and control
- SEMI S2, S8 compliant