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SNE-3200M

Specifications
Electron System
Stage System
Image System
Vacuum System
Dimensions
Resolution
15nm (30kV, SE Image)
20nm (30kV, BSE Image)
Magnification 20x~60,000x
Accelerating Voltage 1~30kV (1/5/10/15/20/30)
Detector
Secondary Electron Image(SE)
Backscattered Electron Image(BSE)
Electron Gun Pre-centered Tungsten Filament Cartridge
Stage Traverse
3-axis System (X, Y, R, Z, T – Manual)
X, Y-axis : 35mm / R-axis : 360°
* Image Shift : ±150μm
* CCD Camera installed in the Chamber
* T-axis : 0 to 45˚ (Option)
Max. Sample Size 70mm in Diameter x 30mm in Height
Automation Function
Auto Start, Auto Focus,
Auto Stigmator, Auto Contrast & Brightness
Image Format BMP, JPEG, PNG, TIFF
Vacuum Mode High & Low Vacuum
Vacuum Pump Rotary Pump / Turbo Molecular Pump (Full Automation)
Main Unit 390(W)x380(D)x560(H)mm, 83kg
Controller Unit 390(W)x325(D)x560(H)mm, 37kg
Rotary Pump 400(W)x160(D)x340(H)mm, 24kg
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Description

About the SNE-3200M

Cost effective Table-top SEM with various functions, SNE-3200M

Performance

15mm

Resolution

60,000x

Magnification

SE / BSE

Multi Detector

Entry-level Table-top SEM with 15nm resolution & 60,000x magnification
Able to use for quality control, R&D and education purpose with various detectors which create surface information images (SE), and material informaiton images (BSE)

SE (Secondary Electron)

▷ Create images with the height level informaiton. Mostly used for surface inspection

BSE(BackScattered Electron)

▷ Create images with material information(Elements)

Convenience

Stage System

X,Y,R (3-axis)
Beam Shift:150μm 

Auto Setting

Focus, Contrast, Brightness

Dual View Mode

SE/BSE Multi Display

Convenient stage movement by 3-axis and able to operate easily and conveniently with mouse control in U.I
Able to check and save both SE/BSE Images together at the same time with dual view mode

    SNE-3200M Quick contact

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